Imaging material strain using advanced electron microscopy

报告人: 韩亦沫 (Rice University)

报告时间: 2024年1月03日 14:00

报告地点: 理科楼C302

报告摘要:Strain plays a critical role in nanomaterials as it affects a wide range of physical properties, including electronic, optical, mechanical, and chemical characteristics. Here, we introduce a new approach using four-dimensional scanning transmission electron microscopy (4D-STEM) to image strain in nanomaterials, offering improved resolution, higher precision, and the ability to visualize the local structure of unique deformations confined within lower-dimensional materials. Specifically, this presentation will focus on our recent study of strain-engineered two-dimensional materials and catalytic nanoparticles. We have uncovered specific strain relaxation pathways and revealed a novel approach to stabilize strain in nanoscale materials. The talk will also discuss the potential of using machine learning to advance multidimensional electron microscopy in the study of strain.

报告人简介:Dr. Han is an assistant professor of Materials Science and NanoEngineering at Rice University. She received her B.S. in Physics from Tsinghua University, and Ph.D. in Applied Physics from Cornell. She worked as a postdoctoral research in the Department of Molecular Biology at Princeton University to expand her knowledge on cryo-EM from 2018 to 2020. Dr. Han started her own lab in July 2020. Dr. Han has achieved recognition for her contributions to the field, receiving awards including the NSF CAREER award, the Roy E. Campbell Faculty Development Award, and being named to the MIT Technology Review's Innovators Under 35 China list.